About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.
1. Evaluation of thermal
conductivity of solid materials
2.
Evaluation of thermal conductivity of electronic device materials
1. Completely automated
measurement with PC.
2.
Applicable to high thermal conductivity materials using high speed transient memory
3.
Laser beam is shut off by a completely sealed basic unit. Compatible with safety standards
for laser products (JIS C 6802-1997).
4.
Substrate measurement attachment is available for a 1 inch x 1 inch sample not more than 1
mm in thickness.
5.
Stepwise heating attachment can be added for evaluation of heterogeneous materials.
| Temperature range | 1) R.T. to 1500 ºC | 2) －120 to 200 ºC |
| Sample size | Standard:
10mm dia. x 1 to 3 mm thick Substrate measurement method: 2.5 x 2.5 x 1 mm thick or less (option) Stepwise heating method: 30mm dia. x 3 to 5 mm thick (option) |
|
| Laser output | Nd glass laser (normal oscillation 10 J/pulse or more) | |
| Measurement atmosphere | Vacuum or inert gas | |
| Measurement accuracy | Thermal diffusivity: within ± 5%, specific heat capacity: ± 7% | |